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chapter 10, Signal-to-noise Performance

Author(s): James R. Janesick
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Chapter Contents

  • 10.1 Uniform Stimulus
  • 10.2 Image S/N Performance
  • 10.3 Flat Fielding
  • 10.4 Image Averaging
  • 10.5 On-Chip Averaging

Excerpt

10.1 Uniform Stimulus

Data from a PTC provides signal-to-noise (S/N) performance directly (i.e., no further data taking is necessary). S/N is determined by dividing signal by noise for each PTC data point taken. The result is plotted as a function of signal in either DN or electron units.

In equation form, S/N for a uniform flat-field stimulus input is given by

math
Three different noise regimes exist over an S/N plot: read noise, shot noise, and FPN. S/N for the read noise regime is
math
which is proportional to signal and produces a slope 1 curve when plotted on log-log coordinates.

The S/N within the shot noise regime is

math
and increases by the square root of signal with a slope of 1/2.

The S/N within the FPN regime is

math
and is independent of signal, producing a slope of 0. The FPN regime begins at a signal level of 1/PN2 of approximately 10,000 e for CCD and CMOS imagers. Beyond this signal level, S/N performance is fixed at about 1/PN = 100.



©2007 Society of Photo-Optical Instrumentation Engineers
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BOOK DATA

Print ISBN:

9780819467225

eISBN:

9780819478382

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