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chapter 8, Flat Fielding

Author(s): James R. Janesick
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Chapter Contents

  • 8.1 Theory
  • 8.2 Photon Transfer Verification
  • 8.3 Nonlinearity

Excerpt

8.1 Theory

Fixed pattern noise is removed from images by a technique called flat fielding, where a computer adjusts pixel sensitivities to be equal. Fixed pattern noise severely limits S/N performance for CCD and CMOS imagers, which will be discussed in Chapter 10. Fortunately, simple computer algorithms can remove FPN and achieve the shot noise limit, thereby significantly improving S/N performance. The image processing routine is based on the following linear equation:

math
where SiCOR is the signal level of the corrected ith pixel without FPN (e), SiRAW is the signal level of the ith raw uncorrected pixel (e), SiFF is the signal level of the ith flat-field pixel used to remove FPN (e), and μFF is the average flat-field signal level (e). Equation (8.1) also can be applied directly to DN camera units as
math
For PT work, it should be mentioned that flat fielding can be substituted for the frame differencing technique illustrated in Fig. 5.3 to remove FPN. In doing so, the number of frames required to generate PTCs is reduced, and the flat-fielding process is verified for theoretical shot noise limited performance.

The flat-fielding technique demonstrated in Fig. 8.1 shows two raw sinusoidal video traces that are FPN limited (labeled as SRAW). Also presented is a flat-field trace used to remove FPN (labeled as SFF). The solid dark curves shown are the corrected traces after the raw traces are divided (pixel-by-pixel) by the flat-field level and the result multiplied by μFF according to Eq. (8.1). Note that S/N performance improves significantly after flat fielding. Figure 8.2 presents images for the lowest-contrast sinusoidal shown in Fig. 8.1 before and after flat fielding is performed. The improvement in image quality is obvious.

After flat fielding is performed, the corrected image contains “remnant shot noise” from the flat field itself.



©2007 Society of Photo-Optical Instrumentation Engineers
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Print ISBN:

9780819467225

eISBN:

9780819478382

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