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Improved similarity measure-based graph embedding for face recognition
J. Electron. Imaging 21, 013002 (Feb 22, 2012); http://dx.doi.org/10.1117/1.JEI.21.1.013002
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Add to FacebookWe propose an improved similarity measure (ISM) and apply it to the existing graph embedding (GE) framework to derive a new improved similarity measure-based graph embedding (ISM-GE) method for face recognition. Our work is motivated by the fact that both the Euclidean metric and the correlation metric are useful and effective for characterizing the similarity of face samples, and we combine these two metrics to form a new ISM to measure the similarity of face samples. We further utilize the proposed ISM in the existing GE framework and develop a new ISM-GE method for face feature extraction and recognition. Experimental results on two widely used face databases demonstrate the efficacy of the proposed method.
© 2012 SPIE and IS&T
History
Received Dec 28, 2010
Accepted Dec 21, 2011
Revised Nov 27, 2011
Published online Feb 22, 2012
Accepted Dec 21, 2011
Revised Nov 27, 2011
Published online Feb 22, 2012
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Yongxin Ge, Dan Yang, Xiaohong Zhang and Jiwen Lu, "Improved similarity measure-based graph embedding for face recognition",
J. Electron. Imaging 21, 013002 (Feb 22, 2012); http://dx.doi.org/10.1117/1.JEI.21.1.013002
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