Three-dimensional point spread function of multilayered flat lenses and its application to extreme subwavelength resolution

Zapata-Rodríguez, Carlos J.; Pastor, David; Camps, Vicente; Caballero, María T.; Miret, Juan J.

doi:doi:10.1117/1.3590244

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Journal of Nanophotonics / Volume 5 / Special Section: Selected Papers from the 3rd Mediterranean Conference on Nanophotonics

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Three-dimensional point spread function of multilayered flat lenses and its application to extreme subwavelength resolution

J. Nanophoton. 5, 051807 (May 20, 2011); http://dx.doi.org/10.1117/1.3590244

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Abstract

References (17)

Citing Articles (6)

Carlos J. Zapata-Rodríguez and David Pastor

Universidad de Valencia, Departamento de Óptica, Dr. Moliner 50, 46100 Burjassot, Spain carlos.zapata@uv.es

Vicente Camps, María T. Caballero, and Juan J. Miret

Universidad de Alicante, Departamento de Óptica, Farmacología y Anatomía, P.O. Box 99, Alicante, Spain

The three-dimensional (3D) point spread function (PSF) of multilayered flat lenses was proposed in order to characterize the diffractive behavior of these subwavelength image formers. We computed the polarization-dependent scalar 3D PSF for a wide range of slab widths and for different dissipative metamaterials. In terms similar to the Rayleigh criterion we determined unambiguously the limit of resolution featuring this type of image-forming device. We investigated the significant reduction of the limit of resolution by increasing the number of layers, which may drop nearly 1 order of magnitude. However, this super-resolving effect is obtained in detriment of reducing the depth of field. Limitations exist on the formation of 3D images.

History

Received Feb 04, 2011
Accepted Apr 18, 2011
Revised Apr 18, 2011
Published online May 20, 2011

Digital Object Identifier

http://dx.doi.org/10.1117/1.3590244

Citation

Carlos J. Zapata-Rodríguez, David Pastor, Vicente Camps, María T. Caballero and Juan J. Miret, "Three-dimensional point spread function of multilayered flat lenses and its application to extreme subwavelength resolution", J. Nanophoton. 5, 051807 (May 20, 2011); http://dx.doi.org/10.1117/1.3590244