Spectroscopic ellipsometry of few-layer graphene

Isić, Goran; Jakovljević, Milka; Filipović, Marko; Jovanović, Djordje; Vasić, Borislav; Lazović, Saša; Puač, Nevena; Petrović, Zoran Lj.; Kostić, Radmila; Gajić, Radoš; Humlíček, Jozef; Losurdo, Maria; Bruno, Giovanni; Bergmair, Iris; Hingerl, Kurt

doi:doi:10.1117/1.3598162

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Journal of Nanophotonics / Volume 5 / Special Section: Selected Papers from the 3rd Mediterranean Conference on Nanophotonics

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Spectroscopic ellipsometry of few-layer graphene

J. Nanophoton. 5, 051809 (Jun 08, 2011); http://dx.doi.org/10.1117/1.3598162

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Abstract

References (19)

Citing Articles (1)

Goran Isić, Milka Jakovljević, Marko Filipović, Djordje Jovanović, Borislav Vasić, Saša Lazović, Nevena Puač, Zoran Lj. Petrović, Radmila Kostić, and Radoš Gajić

University of Belgrade, Institute of Physics, Pregrevica 118, 11080 Belgrade, Serbia

University of Leeds, School of Electronic and Electrical Engineering, Leeds LS2 9JT, United Kingdom

Jozef Humlíček

Masaryk University Brno, Department of Condensed Matter Physics, Faculty of Science, Kotlarska 2, CZ 61137 Brno, Czech Republic

Maria Losurdo and Giovanni Bruno

University of Bari, Institute of Inorganic Methodologies and of Plasmas, IMIP-CNR, Department of Chemistry, via Orabona 4, 70126 Bari, Italy

Iris Bergmair

Functional Surfaces and Nanostructures, Profactor GmbH, Im Stadtgut A2, 4407 Steyr-Gleink, Austria

Kurt Hingerl

Johannes Kepler University Linz, Center for Surface- and Nanoanalytics, Altenbergerstr. 69, A-4040 Linz, Austria

The optical properties of few-layer graphene (FLG) films were measured in the ultraviolet and visible spectrum using a spectroscopic ellipsometer equipped with a 50-μm nominal microspot size. The FLG thickness was found by atomic force microscopy. Measurements revealed that the microspot is larger than the FLG flake. The ellipsometric data was interpreted using the island-film model. Comparison with graphite and recently published graphene data showed reasonable agreement, but with some features that could not be explained. The error margin for the optical constants was estimated to be ±10%.

History

Received Feb 02, 2011
Accepted May 18, 2011
Revised May 02, 2011
Published online Jun 08, 2011

Digital Object Identifier

http://dx.doi.org/10.1117/1.3598162

Citation

Goran Isić, Milka Jakovljević, Marko Filipović, Djordje Jovanović, Borislav Vasić, Saša Lazović, Nevena Puač, Zoran Lj. Petrović, Radmila Kostić, Radoš Gajić, Jozef Humlíček, Maria Losurdo, Giovanni Bruno, Iris Bergmair and Kurt Hingerl, "Spectroscopic ellipsometry of few-layer graphene", J. Nanophoton. 5, 051809 (Jun 08, 2011); http://dx.doi.org/10.1117/1.3598162