SPIEDL Logo

You are not logged in Logged Out Log In

Scale-reduction rule without drop in the sensitivity of a silicon-based guided-wave optical pressure sensor using a micromachined diaphragm

Opt. Eng. 51, 014401 (Feb 07, 2012); http://dx.doi.org/10.1117/1.OE.51.1.014401

Masashi Ohkawa and Takashi Sato

Niigata University, Faculty of Engineering, 8050 Ikarashi 2-no-cho, Nishi-ku Nigata 950-2181, Japan

In this study, an original scale-reduction rule without a drop in the sensitivity of a guided-wave optical pressure sensor was obtained using a micromachined diaphragm. The sensor has a rectangular diaphragm as a pressure-sensitive structure and a sensing waveguide across the diaphragm. Its sensitivity is theoretically known to be strongly dependent on the dimensions of the diaphragm. According to the theoretical results, the sensitivity can be kept constant even if the diaphragm dimensions are reduced as long as both the aspect ratio and the characteristic length of the diaphragm remain constant. Here, the characteristic length is introduced as the cube of either width or length of the rectangular diaphragm divided by the square of its thickness. Such a scale-reduction rule would be very useful for miniaturizing a sensor without reducing sensitivity, although it has not been experimentally confirmed. In this study, the scale-reduction rule was experimentally examined using three fabricated sensors with the same aspect ratio and the same characteristic length. The measured sensitivities of the three sensors were quite similar to each other, as theoretically predicted.

© 2012 Society of Photo-Optical Instrumentation Engineers

History
Received Sep 16, 2011
Accepted Nov 30, 2011
Revised Nov 22, 2011
Published online Feb 07, 2012
Citation
Masashi Ohkawa and Takashi Sato, "Scale-reduction rule without drop in the sensitivity of a silicon-based guided-wave optical pressure sensor using a micromachined diaphragm", Opt. Eng. 51, 014401 (Feb 07, 2012); http://dx.doi.org/10.1117/1.OE.51.1.014401

DOWNLOAD ARTICLE

LOG IN or SELECT A PURCHASE OPTION:

RELATED CONTENT

More Like This Article


For access to fully linked references, you need to log in.

Close

close