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Studies of phase retardation plates with universal null polarimeter
Proc. SPIE 4148, 137 (2000); http://dx.doi.org/10.1117/12.388436
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Add to FacebookThe high-accuracy polarimetric technique for testing the retardation and the other parameters of phase retardation plates is described. It is based on the so-called universal null-polarimeter for crystal optical studies and represents an improved version of the method developed earlier by the authors. The influence of optical activity, dichroism and multiple reflection effects on the final data is analyzed. The experimental results on several commercial retardation plates made from quartz and lithium niobate are reported.
© 2003 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
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Online Aug 01, 2003
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Oleg S. Kushnir, O. S. Dzendzelyuk, V. A. Grabovski and V. B. Mikhailik, "Studies of phase retardation plates with universal null polarimeter",
Proc. SPIE 4148, 137 (2000); http://dx.doi.org/10.1117/12.388436
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