Incorporation of measured natural reflectivities in a background clutter simulation

Sheffer, Jr., Albert D.; Cathcart, J. Michael; Hahn, Steven R.; Harbert, Simeon D.

doi:doi:10.1117/12.542771

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Proceedings / Volume 5431 / Target and Background Representation

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Incorporation of measured natural reflectivities in a background clutter simulation

Proc. SPIE 5431, 260 (2004); http://dx.doi.org/10.1117/12.542771

Monday 12 April 2004

Orlando, FL, USA

Targets and Backgrounds X: Characterization and Representation

Wendell R. Watkins, Dieter Clement, William R. Reynolds

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Abstract

Albert D. Sheffer, Jr., J. Michael Cathcart, Steven R. Hahn, and Simeon D. Harbert

Georgia Institute of Technology (USA)

Modeling of material reflectance in simulated infrared/electro-optical scenes is typically done assuming a Gaussian distribution or similar simple statistical model, because of limited available measured data. Such an approach fails to capture the true reflectance statistics for active systems such as laser sensors. A new approach developed for a data-rich environment will be described, as applied to a laser sensor simulation. This approach utilizes a large database of recently collected laser sensor data to derive reflectance histograms for each material type in a scene. Simulated imagery using such sampled histograms is much more faithful to actual system imagery than that based on traditional statistical models. The paper will describe the material database and the algorithms by which it is utilized in the simulation, and will present resulting simulated imagery and comparisons to simulated imagery using Gaussian reflectivity models.

History

Online Oct 20, 2004

Digital Object Identifier

http://dx.doi.org/10.1117/12.542771

Citation

Albert D. Sheffer, Jr., J. Michael Cathcart, Steven R. Hahn and Simeon D. Harbert, "Incorporation of measured natural reflectivities in a background clutter simulation", Proc. SPIE 5431, 260 (2004); http://dx.doi.org/10.1117/12.542771