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New ultrahigh-speed CCD camera achieves sub-electron read noise using on-chip multiplication gain (EMCCD) technology
Proc. SPIE 5580, 905 (2005); http://dx.doi.org/10.1117/12.602558
Monday 20 September 2004
Alexandria, VA, USA
26th International Congress on High-Speed Photography and Photonics
Dennis L. Paisley, Stuart Kleinfelder, Donald R. Snyder, Brian J. Thompson
The imaging performance of a high speed camera utilizing novel "on-chip electron multiplication gain CCD (EMCCD)" technology is presented. The EMCCD technology has become a popular choice for low-light, high-speed scientific imaging and spectroscopy applications. By amplifying the signal right on the CCD, the new technology overcomes the read noise limitation, typical of high speed CCD cameras. Using all solid-state technology, the EMCCDs alleviate the shortcomings of the traditional amplification technologies using external photocathode materials such as intensified CCD (ICCD) and electron-bombarded CCD (EBCCD) cameras. For example, the technology is not susceptible to burn-in or damage in high light conditions and does not suffer from potential loss of spatial resolution in the photocathode material. A new camera, Cascade:128+, was developed using back illuminated, frame transfer EMCCD with 128x128 pixels to achieve frame rates in excess of 510 full frames per second and the system read noise below one electron rms. Custom data acquisition hardware and software allow real time access to the image data. The camera is ideal for high-frame rate, low-light level imaging applications in physical and biological sciences including adaptive optics, plasma diagnostics, neural-imaging and single molecule tracking.
© 2005 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.
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Online Mar 25, 2005
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Ravi K. Guntupalli, Vern Hagan, Andrew Cooper and Raymond W. Simpson, "New ultrahigh-speed CCD camera achieves sub-electron read noise using on-chip multiplication gain (EMCCD) technology",
Proc. SPIE 5580, 905 (2005); http://dx.doi.org/10.1117/12.602558
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