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Critical parameters for grinding large sapphire window panels

Proc. SPIE 6545, 654517 (2007); http://dx.doi.org/10.1117/12.720129

Wednesday 11 April 2007
Orlando, FL, USA
Window and Dome Technologies and Materials X
Randal W. Tustison
  • Abstract
Joseph R. Bashe, Gene Dempsey, Ikerionwu A. Akwani, Keith T. Jacoby, and Douglas L. Hibbard

Exotic Electro-Optics

Advances in optical manufacturing and testing technologies for sapphire material are required to support the increasing use of large-aperture sapphire panels as windscreens for various electro-optical system applications. Single surface grinding is a crucial process step in both the figuring and finishing of optical components. Improper grinding can make subsequent polishing operations more difficult and time consuming. Poor grinding can also lead to the introduction of surface stress and sub-surface damage which can affect critical opto-mechanical performance characteristics such as strength and durability. Initial efforts have been completed at Exotic Electro-Optics under the funding of the Office of Naval Research and the Air Force Research Laboratory to investigate a number of process enhancements in the grinding of a-plane sapphire panels. The information gained from this study will ultimately provide a better understanding of the overall manufacturing process leading to optimized process time and cost. EEO has completed two sets of twelve-run Plackett-Burman designs of experiment (DOE) to study the effects of fundamental grinding parameters on sapphire panel surfaces. The relative importance of specific process parameters on window characteristics including surface roughness, stress, sub-surface damage are reported.

© 2007 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

History
Online May 02, 2007
Citation
Joseph R. Bashe, Gene Dempsey, Ikerionwu A. Akwani, Keith T. Jacoby and Douglas L. Hibbard, "Critical parameters for grinding large sapphire window panels", Proc. SPIE 6545, 654517 (2007); http://dx.doi.org/10.1117/12.720129

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