Multicamera phase measuring profilometry for accurate depth measurement

Wang, Yongchang; Liu, Kai; Hao, Qi; Lau, Daniel; Hassebrook, Laurence G.

doi:doi:10.1117/12.720068

My Subscription | My Email Alerts | My Article Collections

BROWSE PROCEEDINGS

Proceedings

BROWSE JOURNALS

Journals

BROWSE SPIE eBOOKS

SPIE eBooks

SUBSCRIPTIONS & PRICING

GENERAL INFORMATION

You are not logged in Logged Out Log In

Proceedings / Volume 6555 / Camera-Based Sensing

Previous Article | Next Article

Multicamera phase measuring profilometry for accurate depth measurement

Proc. SPIE 6555, 655509 (2007); http://dx.doi.org/10.1117/12.720068

Monday 9 April 2007

Orlando, FL, USA

Sensors and Systems for Space Applications

Richard T. Howard, Robert D. Richards

Alerts
- Alert Me When Cited
- Alert Me When Corrected
Tools
Share
- Email Abstract
- Connotea
- CiteULike
- del.icio.us
- BibSonomy
- Tweet this Article
- Add to Facebook

Abstract

Yongchang Wang, Kai Liu, Qi Hao, Daniel Lau, and Laurence G. Hassebrook

Univ. of Kentucky

Structured light illumination refers to a scanning process of projecting a series of patterns such that, when viewed from an angle, a camera is able to extract range information. Ultimately, resolution in depth is controlled by the number of patterns projected which, in turn, increases the total time that the target object must remain still. By adding a second camera sensor, it becomes possible to not only achieve wrap around scanning but also reduce the number of patterns needed to achieve a certain degree of depth resolution. But a second camera also makes it possible to reconstruct 3-D surfaces through stereo-vision techniques and triangulation between the cameras instead of between the cameras and the projectors. For both of these two tasks, correspondence between points from two cameras is essential. In this paper, we develop a new method to find the correspondence between the two cameras using both the phase information generated by the temporal multiplexed illumination patterns and stereo triangulation. We also analyze the resulting correspondence accuracy as a function of the number of structured patterns as well as the geometric position of projector to cameras.

History

Online May 03, 2007

Digital Object Identifier

http://dx.doi.org/10.1117/12.720068

Citation

Yongchang Wang, Kai Liu, Qi Hao, Daniel Lau and Laurence G. Hassebrook, "Multicamera phase measuring profilometry for accurate depth measurement", Proc. SPIE 6555, 655509 (2007); http://dx.doi.org/10.1117/12.720068