Prof. Akke S. J. Suiker
at Technische Univ Eindhoven
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 8 July 2021 Presentation + Paper
S. Maraghechi, E. Bosco, J. P. Hoefnagels, A. S. Suiker
Proceedings Volume 11784, 1178415 (2021) https://doi.org/10.1117/12.2593451
KEYWORDS: Optical fibers, Digital image correlation, Statistical analysis, Speckle pattern, Reliability, Particles, Optical interferometry, Mirrors, Microscopy, Calibration

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