Prof. Arup Kumar Raychaudhuri Profile

Prof. Arup Kumar Raychaudhuri

at Indian Institute of Science

SPIE Involvement:

Author

Publications (8)

Proceedings Article | 23 May 2005 Paper

Paper

Experimental study of Rayleigh instability in metallic nanowires using resistance fluctuations measurements from 77K to 375K

Aveek Bid, Achyut Bora, Arup Raychaudhuri

Proceedings Volume 5843, (2005) https://doi.org/10.1117/12.609419

KEYWORDS: Resistance, Silver, Copper, Temperature metrology, Metals, Polymers, Interference (communication), Digital signal processing, Transformers, Nanowires

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Proceedings Article | 23 May 2005 Paper

Paper

Study of thermal fluctuations during thermal denaturation of DNA

K. S. Nagapriya, Arup Raychaudhuri, Dipankar Chatterji

Proceedings Volume 5841, (2005) https://doi.org/10.1117/12.609411

KEYWORDS: Temperature metrology, Liquids, Linear filtering, Liquid crystals, Platinum, Resistance, Bridges, Digital signal processing, Signal processing, Copper

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Proceedings Article | 25 May 2004 Paper

Paper

Study of conductance fluctuations (1/f alpha noise) in metallic nanowires

Aveek Bid, Arup Raychaudhuri

Proceedings Volume 5469, (2004) https://doi.org/10.1117/12.545333

KEYWORDS: Silver, Temperature metrology, Diffusion, Resistance, Motion models, Data modeling, Metals, Transformers, Polymers, Nanowires

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Proceedings Article | 25 May 2004 Paper

Paper

Variation of the probability density function of resistance fluctuations across the metal insulator transition in Si:P

Swastik Kar, Arup Raychaudhuri

Proceedings Volume 5469, (2004) https://doi.org/10.1117/12.546887

KEYWORDS: Doping, Resistance, Transition metals, Metals, Filtering (signal processing), Digital signal processing, Statistical analysis, Temperature metrology, Electronic filtering, Electrons

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Proceedings Article | 25 May 2004 Paper

Paper

Low-frequency non-Gaussian conductance fluctuations in Si near the insulator-metal transition

Arup Raychaudhuri, Swastik Kar, Arindam Ghosh

Proceedings Volume 5469, (2004) https://doi.org/10.1117/12.546850

KEYWORDS: Silicon, Transition metals, Doping, Crystals, Magnetism, Physics, Glasses, Semiconducting wafers, Quantum physics, Temperature metrology

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Proceedings Article | 25 May 2004 Paper

Paper

Low-frequency conductance fluctuations in a shape memory alloy near the martensite transition

Arindam Ghosh, Ayan Guha, Arup Raychaudhuri

Proceedings Volume 5469, (2004) https://doi.org/10.1117/12.546138

KEYWORDS: Shape memory alloys, Temperature metrology, Resistance, Physical phenomena, Metals, Copper, Correlation function, Physics, Condensed matter, Solids

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Proceedings Article | 25 May 2004 Paper

Paper

Study of conductance fluctuations (1/f alpha noise) in metal film with electromigration stressing

Achyut Bora, Arup Raychaudhuri

Proceedings Volume 5469, (2004) https://doi.org/10.1117/12.546855

KEYWORDS: Copper, Aluminum, Metals, Resistance, Temperature metrology, Diffusion, Motion models, Bridges, Atomic force microscopy, Sputter deposition

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Proceedings Article | 9 May 2003 Paper

Paper

Low-frequency noise in charge-ordered system Pr0.63Ca0.37MnO3 near the charge-ordering transition and in the current-induced destabilized state

Aveek Bid, Arup Raychaudhuri

Proceedings Volume 5112, (2003) https://doi.org/10.1117/12.497030

KEYWORDS: Resistance, Temperature metrology, Spectroscopy, Picosecond phenomena, Carbon monoxide, Amplifiers, Commercial off the shelf technology, Crystals, Transformers, Ferromagnetics

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Showing 5 of 8 publications

Conference Committee Involvement (3)

Fluctuations and Noise in Materials II

24 May 2005 | Austin, Texas, United States

Fluctuations and Noise in Materials

26 May 2004 | Maspalomas, Gran Canaria Island, Spain

Noise as a Tool for Studying Materials

2 June 2003 | Santa Fe, New Mexico, United States

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