Asmaa Rabie
at Siemens EDA
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 23 March 2020 Presentation + Paper
Proceedings Volume 11328, 1132803 (2020) https://doi.org/10.1117/12.2551827
KEYWORDS: Data modeling, Machine learning, Lithography, Manufacturing, Metals, Critical dimension metrology, Silicon, Photomasks, Etching, SRAF

Proceedings Article | 20 March 2019 Paper
Proceedings Volume 10962, 1096216 (2019) https://doi.org/10.1117/12.2515139
KEYWORDS: Machine learning, Data modeling, Lithography, Neural networks, Manufacturing, Computer simulations, Design for manufacturability, Design for manufacturing, Feature extraction, Electronics

Proceedings Article | 28 March 2014 Paper
Proceedings Volume 9053, 90530F (2014) https://doi.org/10.1117/12.2045744
KEYWORDS: Double patterning technology, Metals, Photomasks, Lithography, Manufacturing, Visualization, Design for manufacturing, Multilayers, Bridges, Standards development

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