Daiki Moriyama
at Tokyo Univ of Agriculture and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2019 Presentation + Paper
Proceedings Volume 10908, 109080U (2019) https://doi.org/10.1117/12.2516115
KEYWORDS: Silicon, Femtosecond phenomena, Electrons, Reflectivity, Laser ablation, Surface plasmons, Polarization, Interfaces, Gallium nitride, Near field

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