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Dr. Daniil A. Abdullaev
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Publications (4)
SPIE Journal Paper | 12 January 2021
Generation of elliptically polarized terahertz radiation from black phosphorus crystallites
Arseniy Buryakov, Farhad Zainullin, Dinar Khusyanov, Daniil Abdullaev, Vadim Nozdrin, Elena Mishina
OE, Vol. 60, Issue 08, 082013, (January 2021) https://doi.org/10.1117/12.10.1117/1.OE.60.8.082013
KEYWORDS: Terahertz radiation, Crystals, Polarization, Phosphorus, Laser beam diagnostics, Nonlinear crystals, Sensors, Polarizers, Optical engineering, Frequency conversion
Proceedings Article | 15 March 2019 Paper
Effects of vacuum-plasma etching on the electrical properties of thin ferroelectric PZT films
Proceedings Volume 11022, 110221B (2019) https://doi.org/10.1117/12.2520548
KEYWORDS: Reactive ion etching, Ferroelectric materials, Dielectric polarization, Etching, Dielectrics, Annealing, Ion beams, Thin films, Dry etching
Proceedings Article | 30 December 2016 Paper
Resistless lithography - selective etching of silicon with gallium doping regions
D. Abdullaev, R. Milovanov, D. Zubov
Proceedings Volume 10224, 102241P (2016) https://doi.org/10.1117/12.2266347
KEYWORDS: Lithography, Gallium, Reactive ion etching, Etching, Silicon, Doping, Ions, Photomasks, Scanning electron microscopy, Resistance
Proceedings Article | 30 December 2016 Paper
Non-destructive determination of thickness of the dielectric layers using EDX
S. Sokolov, E. Kelm, R. Milovanov, D. Abdullaev, L. Sidorov
Proceedings Volume 10224, 1022426 (2016) https://doi.org/10.1117/12.2265570
KEYWORDS: Nondestructive evaluation, Dielectrics, Thin films, Monte Carlo methods, X-rays, Electron beams, Silicon, Aluminum, Silica, Scanning electron microscopy
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