Mr. Dong-Hyun Jang Profile

Dong-Hyun Jang

at Hanyang Univ

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Publications (2)

Proceedings Article | 4 March 2011 Paper

Measurement of nonuniform bowing in GaN/sapphire epi-wafers and subsequent stress analysis by using a theoretical model

Yuseong Jang, Dong-Hyun Jang, Jong-In Shim, Dong-Soo Shin

Proceedings Volume 7939, 79392B (2011) https://doi.org/10.1117/12.874127

KEYWORDS: Semiconducting wafers, Light emitting diodes, Gallium nitride, Data modeling, Stress analysis, Sapphire, Sensors, Optical properties, Luminescence, 3D image processing

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Proceedings Article | 7 January 2008 Paper

Strain analysis in pseudomorphically grown GaN-based multiple epitaxial layers

Donghyun Jang, Jongin Shim

Proceedings Volume 6824, 68240V (2008) https://doi.org/10.1117/12.757296

KEYWORDS: Crystals, Gallium nitride, Strain analysis, Polarization, Aluminum, Gallium, Indium gallium nitride, Multilayers, Semiconducting wafers, Semiconductor lasers

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