E. Lee Stein
Design Engineer - Electrical Automation & Controls
SPIE Involvement:
Author
Area of Expertise:
Dielectric Breakdown of Ultra Thin Composite Films , Passive Millimeter Wave Imaging (35 and 94 GHz) , Passive & Active Millimeter Wave Polarization Phenomenology , High Accuracy Themal Measurements (4.2°K to 573.1°K) , Robust Digital Lock-in Algorithms (via LSM) , High Frequency Anechoic Chamber Design and Construction
Websites:
Profile Summary

Worked for W.L. Gore & Associates for 7 years as an Electrical & Materials Research Engineer and as a Design Engineer for the Electronic Products Division, Machine Design Group at our New Garden facility, located in Landenberg, Pennsylvania.
Publications (10)

Proceedings Article | 12 October 2010 Paper
Proceedings Volume 7837, 78370E (2010) https://doi.org/10.1117/12.864984
KEYWORDS: Polarization, Dielectric polarization, Sensors, Extremely high frequency, Visibility, Target detection, Imaging systems, Millimeter wave imaging, Atmospheric propagation, Environmental sensing

Proceedings Article | 24 September 2009 Paper
Proceedings Volume 7485, 74850G (2009) https://doi.org/10.1117/12.830493
KEYWORDS: Imaging systems, Optical filters, Extremely high frequency, Etching, Antennas, Image filtering, Point spread functions, Microlens array, Fourier transforms, Sensors

Proceedings Article | 24 September 2009 Paper
Proceedings Volume 7485, 74850F (2009) https://doi.org/10.1117/12.830480
KEYWORDS: Imaging systems, Calibration, Sensors, Temperature metrology, Data modeling, Visualization, Antennas, Polarization, Absorption, Data acquisition

Proceedings Article | 24 September 2009 Paper
Proceedings Volume 7485, 74850H (2009) https://doi.org/10.1117/12.831060
KEYWORDS: Sensors, Image sensors, Polarization, Millimeter wave sensors, Extremely high frequency, Imaging systems, Targeting Task Performance metric, Modulation transfer functions, Image processing, Fourier transforms

Proceedings Article | 5 May 2009 Paper
Proceedings Volume 7309, 730908 (2009) https://doi.org/10.1117/12.818858
KEYWORDS: Imaging systems, Extremely high frequency, Point spread functions, Sensors, Upconversion, Antennas, Spatial resolution, Diffraction, Millimeter wave imaging, Image resolution

Showing 5 of 10 publications
Conference Committee Involvement (1)
SPIE DSS Conference - Session Chairperson
1 April 2009 |
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