The remarkable effect on lifetime improvement of copper phthalocianine (CuPc) coated indium tin oxide (ITO) anode of organic light emitting diodes (OLED's) is experimentally well approved. Also known are the electrode morphology, with and without CuPc coating, the energy levels of the used materials, important for charge injection and conduction, the carrier mobility etc. Based on this
knowledge we suggest the model that explains the mechanism behind the lifetime improvement. We argue that the charge accumulation at the interface between the CuPc and the hole transport layer is responsible for screening out of the electric field variations leading to current density homogenization across the OLED surface. The variation of the injection field, introduced by electrode roughness, is estimated for typical indium tin oxide morphology used in OLED production. Without the CuPc hole injection layer a substantial current channeling occurs in OLED's, leading to accelerated device degradation.
We present a theoretical and experimental study of a multilayer organic light emitting device (OLED) with a partially doped emission layer. An extended version of our established "MOLED" device model is used to understand the effects of the partially doped layer on the transport behavior and on the radiative charge recombination distribution as a function of applied bias. A step by step discussion of the possible mechanisms that can be introduced by doping and the resulting changes on the device properties is presented. We have found that under certain conditions the recombination zone is split into two zones leading to an emission color change with increasing voltage.
By using the yellow emitting laser dye derivative 4-(dicyanomethylene)-2-methyl-6-{2-[(4-diphenylaminophenyl]ethyl}-4H-pyran (DCM-TPA) with electron trapping capabilities as a dopant in a standard organic light emitting device, we have achieved high quantum efficiency with excellent color saturation. Furthermore, for this special case a blue-shift of the emission color is observed for increasing bias due to the appearance of a double peak structure of the recombination zone.
We present a microscopic theory of charge transport in conjugated polymers based on polaron drift along polymer segment and on polaron hopping between segments. We show that this model is able to reproduce the current-voltage characteristics of 'good' hole-only devices based on PPV in the whole range of fields. We also present a microscopic theory of electrode injection into conjugated polymers. We show that this model is able to reproduce the current voltage characteristics of contact limited devices based on PPV.
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