Elena Cong
at Semiconductor Manufacturing International Corp.
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 September 2019 Paper
Rachit Sharma, Ingo Bork, Kushlendra Mishra, ShiZhi Lyu, Linna Cong, Mingjing Tian, Malavika Sharma, Bhardwaj Durvasula, Nageswara Rao, Peter Buck
Proceedings Volume 11148, 111480G (2019) https://doi.org/10.1117/12.2536529
KEYWORDS: Process modeling, Photomasks, Etching, Critical dimension metrology, Calibration, Semiconductor manufacturing, Control systems, Model-based design, Scattering, Photoresist processing

Proceedings Article | 3 October 2018 Paper
Proceedings Volume 10810, 108100Z (2018) https://doi.org/10.1117/12.2501753
KEYWORDS: Plasma, Etching, Edge roughness, Oxides, Photomasks, Oxygen, Distortion, Plasma etching

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top