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Erik Sparrer
at Technische Univ Ilmenau
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Author
Publications (3)
Proceedings Article | 13 May 2013 Paper
Measurement, visualization and analysis of extremely large data sets with a nanopositioning and nanomeasuring machine
O. Birli, K.-H. Franke, G. Linß, T. Machleidt, E. Manske, F. Schale, H.-C. Schwannecke, E. Sparrer, M. Weiß
Proceedings Volume 8788, 87880X (2013) https://doi.org/10.1117/12.2020538
KEYWORDS: Visualization, Sensors, Data conversion, Image filtering, Zoom lenses, Blob detection, Calibration, Binary data, Image processing, Detection and tracking algorithms
Proceedings Article | 13 May 2011 Paper
Integration of CMM software standards for nanopositioning and nanomeasuring machines
Proceedings Volume 8031, 80312G (2011) https://doi.org/10.1117/12.882822
KEYWORDS: Human-machine interfaces, Metrology, Data processing, Inspection, Computer programming, Computer architecture, Calibration, MATLAB, Sensors, Measurement devices
Proceedings Article | 22 May 2009 Paper
Kelvin probe force microscopy: measurement data reconstruction
Torsten Machleidt, Erik Sparrer, Tim Kubertschak, Rico Nestler, Karl-Heinz Franke
Proceedings Volume 7378, 73781C (2009) https://doi.org/10.1117/12.821787
KEYWORDS: Point spread functions, Deconvolution, Scanning probe microscopy, Microscopy, Convolution, Microscopes, Data modeling, Chemical elements, Image processing, Analytical research
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