Geng Niu
at Institute of Electrical Engineering
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 6 February 2019 Paper
Weixia Zhao, Junbiao Liu, Geng Niu, Yutian Ma, Yan Wang, Li Han
Proceedings Volume 10842, 108420P (2019) https://doi.org/10.1117/12.2504965
KEYWORDS: X-rays, X-ray computed tomography, X-ray imaging, Image segmentation, Scanning electron microscopy, CT reconstruction, Computed tomography, Principal component analysis, Chromium

Proceedings Article | 24 January 2019 Paper
Proceedings Volume 10840, 108400X (2019) https://doi.org/10.1117/12.2506351
KEYWORDS: X-rays, Electron beams, Monte Carlo methods, Sputter deposition

Proceedings Article | 25 October 2016 Paper
Proceedings Volume 9687, 96870C (2016) https://doi.org/10.1117/12.2245029
KEYWORDS: Electron beams, Scanning electron microscopy, X-ray sources, Edge detection, Reticles, Calibration, Semiconducting wafers, Signal detection, Silicon, Metals

Proceedings Article | 25 October 2016 Paper
Proceedings Volume 9685, 96850I (2016) https://doi.org/10.1117/12.2241728
KEYWORDS: X-ray microscopy, Scanning electron microscopy, Tungsten, X-ray imaging, X-rays, Electron beams, Sensors, X-ray detectors, Signal attenuation, Beryllium

Proceedings Article | 25 October 2016 Paper
Proceedings Volume 9685, 96850J (2016) https://doi.org/10.1117/12.2243125
KEYWORDS: X-ray sources, X-rays, Electron beams, Magnetism, Spatial resolution, Tungsten, Lenses, X-ray imaging, Electrodes, Sensors

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