Dr. Gong Gu Profile

Dr. Gong Gu

at SRI International

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 19 September 2006 Paper

Hysteresis in pentacene-based organic thin-film transistors

Gong Gu, Michael Kane

Proceedings Volume 6336, 63360H (2006) https://doi.org/10.1117/12.679661

KEYWORDS: Electrons, Time metrology, Transistors, Dielectrics, Thin films, Data modeling, Oxygen, Amorphous silicon, Organic semiconductors, Semiconductors

Read Abstract +

Memory effects are commonly seen in organic thin-film transistor (OTFT) characteristics. In the absence of memory effects associated with the gate dielectric, the hysteresis in p-channel pentacene-based OTFTs, as measured in air and under illumination, was found to be dominated by trapped electrons, rather than trapped holes, in the semiconductor. The responsible acceptor type traps have very long lifetime. The immobile, previously stored negative charge requires extra holes to balance it, resulting in early establishment of the channel and extra drain current. This model is unique in that it discusses the majority carrier population influenced by trapped charge opposite in sign to the majority carriers in a simple electrostatic manner, to explain history dependence. The model was supported by drain current transient decay data. This memory effect is ambient and illumination sensitive. We studied the presence or absence of this effect under various ambient and illumination conditions, and found the responsible acceptor type traps mostly extrinsic and their formation reversible. Efforts were taken in the quantitative analysis to exclude the bias stress effect from the memory effect due to the charged acceptors.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years