Han Yu
at Nanjing Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 December 2022 Poster + Paper
Proceedings Volume 12319, 1231918 (2022) https://doi.org/10.1117/12.2642331
KEYWORDS: Defect detection, Light sources and illumination, Image fusion, Detection and tracking algorithms, Reflectivity, Machine vision, Optical inspection

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