Hongchang Wang
at Tongji Univ
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 1 February 2006 Paper
Zhanshan Wang, Fengli Wang, Zhong Zhang, Hongchang Wang, Wenjuan Wu, Shumin Zhang, Zhongxiang Gu, Xinbin Cheng, Bei Wang, Shuji Qin, Lingyan Chen
Proceedings Volume 6034, 60340D (2006) https://doi.org/10.1117/12.668096
KEYWORDS: Reflectivity, X-rays, Beam splitters, Multilayers, Silicon, Polarization, Extreme ultraviolet, Interferometers, Mach-Zehnder interferometers, Plasma

Proceedings Article | 1 February 2006 Paper
Zhong Zhang, Zhanshan Wang, Fengli Wang, Wennjuan Wu, Hongchang Wang, Shuji Qin, Lingyan Chen
Proceedings Volume 6034, 60341Y (2006) https://doi.org/10.1117/12.668172
KEYWORDS: Reflectivity, Copper, X-rays, Hard x-rays, Interfaces, Solids, Diffusion, Sputter deposition, X-ray diffraction, Carbon

Proceedings Article | 1 February 2006 Paper
Shumin Zhang, Zhanshan Wang, Hongchang Wang, Fengli Wang, Zhongxiang Gu, Wenjuan Wu, Zhong Zhang, Yao Xu, Shuji Qin, Lingyan Chen
Proceedings Volume 6034, 60340C (2006) https://doi.org/10.1117/12.668095
KEYWORDS: Multilayers, Reflectivity, X-rays, Mirrors, Hard x-rays, Sputter deposition, X-ray diffraction, Atomic force microscopy, X-ray optics, Grazing incidence

Proceedings Article | 1 February 2006 Paper
Hongchang Wang, Zhanshan Wang, Zhongxiang Gu, Shumin Zhang, Wenjuan Wu, Zhong Zhang, Yao Xu, Fengli Wang, Xinbin Cheng, Bei Wang, Shuji Qin, Lingyan Chen
Proceedings Volume 6034, 603418 (2006) https://doi.org/10.1117/12.668138
KEYWORDS: Reflectivity, X-rays, Polarization, Polarizers, Wave plates, Multilayers, Optical components, Optical design, Numerical analysis, Phase shifts

Proceedings Article | 1 February 2006 Paper
Fengli Wang, Zhanshan Wang, Hongchang Wang, Zhong Zhang, Wenjuan Wu, Yao Xu, Shumin Zhang, Xinbin Chen, Bei Wang, Shuji Qin, Lingyan Chen
Proceedings Volume 6034, 603417 (2006) https://doi.org/10.1117/12.668136
KEYWORDS: Multilayers, Reflectivity, X-rays, Silicon, Interfaces, Sputter deposition, Tungsten, Transmission electron microscopy, X-ray diffraction, Coating

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