Sequential analysis of stray light through a system in the past has only incorporated stray light from a point source scattering off optical surfaces due to contamination and roughness. Any analysis requiring more fidelity required the power of non-sequential ray trace software, which is limited in both speed and sampling. The software presented in this paper expands upon the previously discussed sequential analysis by adding more functionality and detail to the analysis. This includes scatter contributions from an ideal mechanical baffle located at the entrance to the system and the stray light resulting from extended sources, such as an illuminated Earth or Moon. An example case study is presented to demonstrate the correlation to a matching non-sequential analysis of the system.
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