Dr. Jong Bum Lee
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 February 2015 Paper
Jong Bum Lee, Jee Hyong Lee
Proceedings Volume 9445, 94452B (2015) https://doi.org/10.1117/12.2181517
KEYWORDS: Semiconductors, Electronic components, Reliability, Data communications, Electronics, Communication engineering, Fabrication, Data processing, Machine learning, Machine vision

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