Joseph Shen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2018 Presentation + Paper
Proceedings Volume 10749, 1074908 (2018) https://doi.org/10.1117/12.2320419
KEYWORDS: 3D metrology, Metals, Structured light, Optical properties, Cameras, Projection systems, Reflection, Phase measurement, Fringe analysis, Imaging systems

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