Prof. Jun Chen
Professor at Tokyo Polytechnic Univ
SPIE Involvement:
Author
Publications (12)

Proceedings Article | 6 June 2024 Poster
S. Waki, J. Chen, M. Toyoda
Proceedings Volume 13020, (2024) https://doi.org/10.1117/12.3017382
KEYWORDS: Reflectivity, Mirrors, Multilayers, Grazing incidence, Optical design, X-rays, X-ray diffraction, Objectives, Sputter deposition, Silicon

Proceedings Article | 26 April 2019 Paper
Proceedings Volume 11032, 110320P (2019) https://doi.org/10.1117/12.2520543
KEYWORDS: Mirrors, Objectives, X-rays, Optical design, Computer aided design, Ray tracing, Geometrical optics, Paraxial approximations, Aberration theory, X-ray diffraction

Proceedings Article | 19 February 2018 Paper
S. Nakadate, Y. Kume, M. Shibuya, J. Chen, Y. Azuma, T. Moriyama
Proceedings Volume 10556, 105560H (2018) https://doi.org/10.1117/12.2292976
KEYWORDS: Light emitting diodes, Printing, Color reproduction, Light sources and illumination, LCDs, Translucency, Televisions, Optical filters

Proceedings Article | 2 February 2009 Paper
Proceedings Volume 7157, 715702 (2009) https://doi.org/10.1117/12.811995
KEYWORDS: Semiconductor lasers, Phase shifts, Wavefronts, Interferometers, Phase interferometry, Fringe analysis, Gallium nitride, Laser development, Digital video discs, Phase shift keying

Proceedings Article | 20 January 2005 Paper
Jun Chen, Yoh Tanaka, Michio Kiyohara, Motosuke Kiyohara
Proceedings Volume 5633, (2005) https://doi.org/10.1117/12.577051
KEYWORDS: Second-harmonic generation, Wavefronts, Phase shifts, Semiconductor lasers, Interferometers, Phase interferometry, Tunable lasers, Laser stabilization, Laser development, Digital video discs

Showing 5 of 12 publications
Conference Committee Involvement (5)
Optical Metrology and Inspection for Industrial Applications VI
21 October 2019 | Hangzhou, China
Optical Metrology and Inspection for Industrial Applications III
9 October 2014 | Beijing, China
Optical Metrology and Inspection for Industrial Applications II
5 November 2012 | Beijing, China
Advanced Materials and Devices for Sensing and Imaging III
12 November 2007 | Beijing, China
Advanced Materials and Devices for Sensing and Imaging II
8 November 2004 | Beijing, China
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