Kosuke Ishikiriyama
at Intel Kabushiki Kaisha
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 May 2008 Paper
Proceedings Volume 7028, 70281Q (2008) https://doi.org/10.1117/12.793068
KEYWORDS: Photomasks, Etching, Extreme ultraviolet, Reflectivity, Extreme ultraviolet lithography, Ruthenium, Optical lithography, Photoresist processing, Dry etching, Inspection

Proceedings Article | 30 October 2007 Paper
Proceedings Volume 6730, 67305N (2007) https://doi.org/10.1117/12.747722
KEYWORDS: Extreme ultraviolet, Etching, Ruthenium, Reflectivity, Photomasks, Mask making, Inspection, Optical lithography, Line edge roughness, Scanning electron microscopy

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