Luis Agnaldo Gomes Perini
at CEA LETI
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 3 October 2016 Presentation + Paper
Proceedings Volume 9967, 99671A (2016) https://doi.org/10.1117/12.2235993
KEYWORDS: X-rays, Tomography, Signal to noise ratio, Scanning electron microscopy, Electron beams, Nanowires, X-ray imaging, Sensors, X-ray detectors, Spatial resolution

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