Mr. Michael C. Green Profile

Michael C. Green

at Varian Medical Systems Inc

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 16 July 2003 Paper

High-throughput baggage scanning employing x-ray diffraction for accurate explosives detection

Michael Green, Larry Partain

Proceedings Volume 5048, (2003) https://doi.org/10.1117/12.484697

KEYWORDS: X-rays, Diffraction, Sensors, X-ray diffraction, Explosives, X-ray detectors, Explosives detection, Crystals, Collimators, Absorption

Read Abstract +

X-ray systems dominate the installed base of airport baggage scanning systems for explosives detection. The majority are conveyer systems with projection line scanners. These systems can achieve a high throughput but exhibit a high false positive rate and require significant operator involvement. Systems employing computed tomography (CT) are currently being installed at a rapid rate. These can provide good discrimination of levels of xray absorption coefficient and can largely circumvent superimposition effects. Nonetheless CT measures only x-ray absorption coefficient per voxel which does not provide a means of specific material identification resulting in many false positives, and it is relatively straightforward to configure explosive materials so that they are undetectable by CT systems. Diffraction-based x-ray systems present a solution to this problem. They detect and measure atomic layer spacings in crystalline and microcrystalline materials with high sensitivity. This provides a means of specific material identification. The majority of explosive compounds are well crystallized solids at room temperature. X-ray diffraction systems using both conventional wavelength-dispersive diffraction and fixed-angle, multi-wavelength diffraction for improved throughput are described. Large-area, flat-panel x-ray detector technology coupled with an extended x-ray source will permit a full 3D volumetric x-ray diffraction scan of a bag in a single pass, (patent pending).

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years