Dr. Noah Bareket
at Abbott Medical Optics
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 22 January 2001 Paper
Proceedings Volume 4186, (2001) https://doi.org/10.1117/12.410699
KEYWORDS: Photomasks, Inspection, Charged-particle lithography, Extreme ultraviolet, Reticles, Reflectivity, Semiconducting wafers, Silicon, Ultraviolet radiation, Chromium

Proceedings Article | 19 July 2000 Paper
Proceedings Volume 4066, (2000) https://doi.org/10.1117/12.392104
KEYWORDS: Photomasks, Inspection, Extreme ultraviolet, Particles, Lithography, Defect detection, Reflectivity, Semiconducting wafers, Glasses, Multilayers

Proceedings Volume Editor (1)

SPIE Conference Volume | 1 August 1983

Conference Committee Involvement (1)
Wavefront Sensing
24 August 1982 | San Diego, United States
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