Pei-Hang Li
at Beijing Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019 Paper
Proceedings Volume 11057, 1105706 (2019) https://doi.org/10.1117/12.2524878
KEYWORDS: Fringe analysis, Image analysis, Demodulation, Error analysis, Fractional fourier transform, Image processing, Commercial off the shelf technology, Lutetium, Optical interferometry, Fourier transforms

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