Mr. Prashant Potnis Profile

Prashant Potnis

PhD student

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 31 March 2010 Paper

Mapping of domain structure in Barium Titanate single crystals by synchrotron x-ray topography

Prashant Potnis, John Huber, John Sutter, Felix Hofmann, Brian Abbey, Alexander Korsunsky

Proceedings Volume 7644, 76440A (2010) https://doi.org/10.1117/12.845837

KEYWORDS: Crystals, Reflection, Single crystal X-ray diffraction, Ferroelectric materials, Synchrotrons, X-rays, Atomic force microscopy, Scanning electron microscopy, X-ray diffraction, Photomicroscopy

Read Abstract +

Imaging of domains is a key step in understanding the microstructure and hence the properties of ferroelectric single crystals. This understanding is essential for exploiting engineered domain configurations to achieve enhanced performance. In this paper, single crystals of Barium Titanate are observed by reflection topography using unfocussed monochromatic synchrotron X-ray light. A 10 x 10 mm polished surface of an unpoled crystal was mapped to form a composite image, indicating a fine structure of a- and c-domains. By making use of the angular separation of the diffracted reflections and specimen rocking, the relative tilts between adjacent domains about two orthogonal axes were found. Angular resolution better than 0.1mrad in tilt measurements allowed the local elastic curvature of lattice planes to be observed. The resulting composite images show well defined boundaries between regions of distinct microstructure, and give an indication of the proportion of the domain types present. Over large regions of the crystal the domain structure was finer than the X-ray camera resolution of 6.5μm; AFM and SEM imaging of domains was then used to confirm the typical domain spacing. The results are interpreted in the context of models of compatible microstructure in tetragonal crystals using microscopy of etched crystals to assist the interpretation. The technique shows promise for mapping fine microstructure in single crystals, through the use of high resolution X-ray cameras, and is successful in revealing lattice orientation information that is not normally available in optical or AFM measurements.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years