Dr. Roy Geiss Profile

Dr. Roy Geiss

at National Institute of Standards and Technology

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Publications (2)

Proceedings Article | 21 August 2009 Paper

Methods for TEM analysis of NIST's single-walled carbon nanotube Standard Reference Material

Elisabeth Mansfield, Roy Geiss, Jeffrey Fagan

Proceedings Volume 7405, 74050A (2009) https://doi.org/10.1117/12.825406

KEYWORDS: Transmission electron microscopy, Carbon nanotubes, Sodium, Single walled carbon nanotubes, Standards development, Liquids, Manufacturing, Scanning electron microscopy, Graphene, Analytical research

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Proceedings Article | 10 September 2007 Paper

Microstructure of 100 nm damascene copper overburden and lines

R. H. Geiss, D. T. Read

Proceedings Volume 6648, 664808 (2007) https://doi.org/10.1117/12.735021

KEYWORDS: Copper, Scanning electron microscopy, Statistical analysis, Diffraction, Chemical mechanical planarization, Crystals, Transmission electron microscopy, Metals, Backscatter, Semiconducting wafers

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