Sanghyun Son
at SEMES Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 10 August 2023 Poster
Proceedings Volume 12618, 1261827 (2023) https://doi.org/10.1117/12.2673346
KEYWORDS: Temperature metrology, Reflectivity, Calibration, Ultrafast phenomena, Silicon, Semiconducting wafers, Temporal resolution, Wafer-level optics, Reflection, Optical surfaces

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