SeungWoo Lee
at KAIST
SPIE Involvement:
Author
Publications (5)

Proceedings Article | 12 February 2008 Paper
Proceedings Volume 6861, 686115 (2008) https://doi.org/10.1117/12.763253
KEYWORDS: Confocal microscopy, Signal detection, Mirrors, Microscopy, Image acquisition, Image quality, Objectives, Lens design, Optical microscopy, Sensors

Proceedings Article | 8 August 2007 Paper
SeungWoo Lee, Hongki Yoo, Byung Seon Chun, Wanhee Chun, Dae-gab Gweon
Proceedings Volume 6630, 663012 (2007) https://doi.org/10.1117/12.727936
KEYWORDS: Confocal microscopy, Microscopes, Luminescence, Heterodyning, Objectives, Point spread functions, 3D image processing, Image resolution, Diffraction, Sensors

Proceedings Article | 23 February 2006 Paper
Taehoon Kim, Taejoong Kim, SeungWoo Lee, Dae-Gab Gweon, Jungwoo Seo
Proceedings Volume 6090, 60900W (2006) https://doi.org/10.1117/12.646031
KEYWORDS: Signal to noise ratio, 3D modeling, Confocal microscopy, Microscopy, 3D image reconstruction, 3D image processing, 3D metrology, Image processing, Time metrology, Actuators

Proceedings Article | 13 July 2004 Paper
Proceedings Volume 5324, (2004) https://doi.org/10.1117/12.529942
KEYWORDS: Tolerancing, Confocal microscopy, Error analysis, Monte Carlo methods, Microscopy, Manufacturing, Assembly tolerances, Optics manufacturing, Optical components, Quality systems

Proceedings Article | 13 July 2004 Paper
SeugnWoo Lee, Dong-Kyun Kang, HongKi Yoo, Dae-Gab Gweon, Suk-Won Lee, Kwang-Soo Kim
Proceedings Volume 5324, (2004) https://doi.org/10.1117/12.529884
KEYWORDS: Confocal microscopy, Objectives, Mirrors, Relays, Optical design, Lens design, Diffraction, Image acquisition, Sensors, Scanning electron microscopy

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