Shang-Jung Wu
at Taiwan Semiconductor Manufacturing Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 April 2023 Presentation
Danping Peng, Shang-Jung Wu, Jue-Chin Yu, Chia-Hua Chang, Kenneth Ho
Proceedings Volume 12495, 124950I (2023) https://doi.org/10.1117/12.2661726
KEYWORDS: Photomasks, Optical proximity correction, Semiconducting wafers, Data processing, Lithography, Inspection, Image processing

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