Dr. Sumant Sarkar
at Coventor Inc A Lam Research Co
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 10 April 2024 Presentation + Paper
Pradeep Nanja, Brett Lowe, Sumant Sarkar
Proceedings Volume 12954, 1295402 (2024) https://doi.org/10.1117/12.3010192
KEYWORDS: Resistance, Fin field effect transistors, Capacitance

SPIE Journal Paper | 12 July 2023 Open Access
Michael Hargrove, Sandy Wen, Daebin Yim, Kira Egelhofer Ruegger, Pradeep Nanja, Sumant Sarkar, Brett Lowe, Benjamin Vincent, Joseph Ervin, David Fried
JM3, Vol. 22, Issue 03, 031209, (July 2023) https://doi.org/10.1117/12.10.1117/1.JMM.22.3.031209
KEYWORDS: Etching, Metrology, Process modeling, Semiconducting wafers, 3D modeling, 3D metrology, Logic, Critical dimension metrology, Diffractive optical elements, Fabrication

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