Dr. Sunil Kancharana
at Technische Hochschule Ingolstadt
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 5 March 2022 Paper
Mühenad Bilal, Sunil Kancharana, Christian Mayer, Markus Bregulla, Adam Ziębiński, Rafal Cupek
Proceedings Volume 12084, 120840O (2022) https://doi.org/10.1117/12.2623140
KEYWORDS: Damage detection, RGB color model, Image segmentation, Optical microscopes, Image processing, 3D modeling, Inspection, Detection and tracking algorithms, Tin, Scattering

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