Takumi Yoshino
at Toyo Gosei Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 25 March 2019 Paper
Proceedings Volume 10960, 109600D (2019) https://doi.org/10.1117/12.2515149
KEYWORDS: Polymers, Extreme ultraviolet lithography, Absorption, Extreme ultraviolet, Semiconducting wafers, Diffusion, Line width roughness, Chemically amplified resists, Stochastic processes, Head-mounted displays

Proceedings Article | 13 March 2018 Paper
Proceedings Volume 10586, 105860H (2018) https://doi.org/10.1117/12.2297392
KEYWORDS: Polymers, Extreme ultraviolet lithography, Extreme ultraviolet, Electron beams, Chemically amplified resists, Lithography, Absorption, Diffusion, Line width roughness, Molecules

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