Mr. Xiao Feng Profile

Xiao Feng

at East China Normal Univ

SPIE Involvement:

Author

Publications (4)

Proceedings Article | 15 November 2007 Paper

Rating of web pages based on image content analysis

Feng Xiao, Ming Zhang, Liang Tang, Jie Zhou

Proceedings Volume 6788, 67881N (2007) https://doi.org/10.1117/12.749695

KEYWORDS: Skin, Image analysis, Facial recognition systems, Breast, Image segmentation, Internet, Detection and tracking algorithms, Image filtering, Shape analysis, Sensors

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Proceedings Article | 8 December 2004 Paper

Optimized inductor and low-pass filter with low substrate loss on OPS/PS interlayer

Yun Liu, Yanling Shi, Xiao Feng, Yong Wang, Shaoqiang Chen, Xiaojin Li, Ziqiang Zhu, Zongshen Lai

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607442

KEYWORDS: Silicon, Linear filtering, Picosecond phenomena, Metals, Lawrencium, Semiconducting wafers, Inductance, Microwave radiation, Integrated circuits, Circuit switching

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Proceedings Article | 8 December 2004 Paper

Formation of the copper nanoparticles in porous silicon by electroplating

Xiao Feng, Shaohui Xu, Shaoqiang Chen, Jianzhong Zhu, Ziqiang Zhu, Zongshen Lai

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607806

KEYWORDS: Picosecond phenomena, Copper, Silicon, Metals, Electroplating, Raman spectroscopy, Crystals, Scanning electron microscopy, Microcrystalline materials, Etching

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Proceedings Article | 8 December 2004 Paper

Bond enhance of hydroxyapatite/silicon layers by introducing a porous silicon interlayer

Shaoqiang Chen, Jianzhong Zhu, Jian Zhang, Xiao Feng, Yanling Shi, Xiaohua Wang, Laiqiang Luo, Ziqiang Zhu

Proceedings Volume 5774, (2004) https://doi.org/10.1117/12.607803

KEYWORDS: Silicon, Silicon films, Picosecond phenomena, Atomic force microscopy, Scanning electron microscopy, Semiconducting wafers, Crystals, Reflection, Calcium, Wafer bonding

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