Yamei Li
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 November 2009 Paper
Yamei Li, Jihua Wen, Yanling Ma
Proceedings Volume 7508, 75080U (2009) https://doi.org/10.1117/12.837574
KEYWORDS: LCDs, Sensors, Data conversion, Error analysis, Temperature metrology, Microcontrollers, Interfaces, System integration, Integrated circuit design, Integrated circuits

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