Ying Li
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 December 2022 Paper
Proceedings Volume 12319, 123190Q (2022) https://doi.org/10.1117/12.2645474
KEYWORDS: Particles, Scanning electron microscopy, Shape analysis, Electron microscopes, Atmospheric particles, 3D metrology, Laser applications, Image analysis, Error analysis, Transmission electron microscopy

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