Yuanlu Xue
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 15 February 2024 Paper
Proceedings Volume 13069, 1306906 (2024) https://doi.org/10.1117/12.3023248
KEYWORDS: Fringe analysis, Super resolution, 3D metrology, Education and training, Cameras, 3D projection, Convolution, Tunable filters, 3D image processing, Visualization

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