Zhi-wei Yu
at Dalian Maritime Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 October 2013 Paper
Zhiwei Yu, Mudi Xiong, Zhuqing Niu
Proceedings Volume 8921, 89212C (2013) https://doi.org/10.1117/12.2031817
KEYWORDS: Detection and tracking algorithms, Defect detection, Eye, Feature extraction, Data centers, Xenon, Resistance, Hough transforms, Image processing, Image processing algorithms and systems

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