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Dr. Massimiliano Barone
at STMicroelectronics
SPIE Involvement:
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Publications (1)
Proceedings Article | 5 March 2022 Paper
The high variety of image wafer inspection field
Massimiliano Barone, Matteo Fedeli
Proceedings Volume 12084, 120840K (2022) https://doi.org/10.1117/12.2622457
KEYWORDS: Semiconducting wafers, Wafer testing, Wafer inspection, Inspection, Image analysis, Image segmentation, Acoustics, Image acquisition, Defect detection, Wafer bonding
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