PROCEEDINGS VOLUME 9687
EIGHTH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY (AOMATT2016) | 26-29 APRIL 2016
8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics
Editor Affiliations +
IN THIS VOLUME

3 Sessions, 15 Papers, 0 Presentations, 0 Posters
Oral Session  (8)
EIGHTH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGY (AOMATT2016)
26-29 April 2016
Suzhou, China
Front Matter: Volume 9687
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968701 (2016) https://doi.org/10.1117/12.2257119
Oral Session
Gerd Ehret, Susanne Quabis, Michael Schulz
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968702 (2016) https://doi.org/10.1117/12.2243608
Xianbo Shi, Lahsen Assoufid, Ruben Reininger
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968703 (2016) https://doi.org/10.1117/12.2241139
Lei Huang, Mourad Idir
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968704 (2016) https://doi.org/10.1117/12.2241522
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968705 (2016) https://doi.org/10.1117/12.2243422
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968706 (2016) https://doi.org/10.1117/12.2244271
Xudong Xu, Shuang Ma, Zhengxiang Shen, Qiushi Huang, Zhanshan Wang
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968707 (2016) https://doi.org/10.1117/12.2243152
Y. Kondo, Y. Bitou, Kazuhide Yamauchi
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 968708 (2016) https://doi.org/10.1117/12.2242806
Bo Yu, Chun-shui Jin, Shun Yao
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870A (2016) https://doi.org/10.1117/12.2246160
9687 Poster Session
Kai Ma, Zhan Shi, Chao Chen, Xiaodong Pan, Wenbin Liu
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870B (2016) https://doi.org/10.1117/12.2242784
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870C (2016) https://doi.org/10.1117/12.2245029
Shinan Qian, Mourad Idir
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870D (2016) https://doi.org/10.1117/12.2247575
Shinan Qian, Bo Gao
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870E (2016) https://doi.org/10.1117/12.2247578
Duan-Jen Wang, Shang-Wei Lin, Shen-Yaw Perng
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870F (2016) https://doi.org/10.1117/12.2247664
Mourad Idir, Lei Huang, Konstantine Kaznatcheev, Shinan Qian, Guillaume Dovillaire, Rafael Mayer
Proceedings Volume 8th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Subnanometer Accuracy Measurement for Synchrotron Optics and X-Ray Optics, 96870G (2016) https://doi.org/10.1117/12.2248223
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