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Visualization of enhanced optical fields in metallic and dielectric nanostructures resonated with infrared light is fundamentally important to control optical properties of metamaterials. However, conventional optical microscopic techniques, such as Fourier Transform Infrared absorption spectroscopy cannot resolve optically induced light fields of dielectric structures because of their low spatial resolution due to the diffraction limit of the infrared light. We introduced super-resolution far-field infrared spectroscopy to visualize the distribution of optical fields of dielectric-based metamaterials in the infrared region. Our newly developed novel infrared spectroscopic technique called as mid-infrared photothermal microscopy demonstrates to investigate optical field properties of silicon-based metamaterials at the sub-micrometer scale, which is far-beyond the diffraction limit of the infrared light.
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